V-700 Series Automated Absolute Reflectance Measurement System
The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements.
Features
System Description
Coupled with the JASCO V-700 UV/Vis/NIR Spectrophotometers, the instrument system provides measurements of challenging samples with dramatically reduced noise and excellent photometric stability. The incidence and collection angles can also be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere. Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarization properties of a sample can also be examined using P or S polarization or by setting the desired polarization angles.
System Features
- PC control of instrument conditions such as incidence and collection angles and spectrum measurement parameters
- Wide range of instrument wavelengths, from the ultraviolet to near infrared region
- Superior photometric stability using a double-beam optical configuration
- Individual control of incidence and collection angles
- Standard polarization measurement capability
- Purpose-built sample holder simplifies loading/removal of samples
V-700 Series Specifications
| Wavelength Range | 250 nm to 850 nm (ARV-701) 250 nm to 2000 nm (ARV-702) 250 nm to 1800 nm (ARV-703) |
| Incidence Angle | 5° to 60°(Reflectance mode) 0° to 60°(Transmittance mode) |
| Sample Dimensions | Minimum 20(H) x 20(W) x 0.5(T) mm Maximum 70(H) x 100(W) x 10(T) mm |
| Detectors | PMT (all models) PbS (ARV-702) InGaAs (ARV-703) |
Details
Transmittance profile of band pass filter
Varying the incidence angle, the transmittance characteristics of a band pass filter are measured. As shown above, the transmittance peak of the band pass filter is shifted about 8 nm to a shorter wavelength range as the incident angle is changed from 0 to 10 degrees.
Reflectance profile of dichroic mirror
Varying the incidence angle, the reflectance characteristics of a dichroic mirror using P and S polarization are measured.
Phase difference measurement
By using an angle selective polarizer, measurements of the phase difference of metal films can be provided. Quarter wave plates for evaluation of optical disks can also be inspected.
1. Phase difference (δ) of Al mirror
2. Phase difference (δ) of a sample and Al mirror
3. Phase difference (δ) of a sample
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