The thickness of the epitaxial layer, substrate, etching (residual layer), liquid crystal cell gap, and other semiconductor layers dramatically impacts...
The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of...
Ellipsometry is a method for determining the refractive index and extinction coefficients of a sample by measuring the change in...
The V-1000 was designed to evaluate optical properties in the wavelength range between 115 and 300 nm.
A quantum efficiency measurement system for solid samples integrates the spectrofluorometer with an integrating sphere for fluorescence emission and a...
JASCO's Confocal fluorescence detector can be used to determine the depth of the fluorescent contaminant without destroying the crucible.
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