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FT/IR-6000 Series FTIR Spectrometers


The FT/IR-6000 Series FTIR spectrometers offers an optical bench which can be used (or customized) for a wide range of experimental capabilities from academic research, reverse engineering, R&D to high-end research applications.

The FT/IR-6000 optical bench is based on a 28 degree retro-reflector (corner-cube) mirror Michelson interferometer and designed for absolute flexibility; in its ‘standard’ configuration it has an extensive range of source, beam splitter and detector options from Near-IR to Mid-IR to Far-IR measurements.


The FT/IR-6000 is purgeable as standard, to reduce the interference of environmental gases and vapors on the sample spectrum (CO2 and H20 elimination algorithms are also provided). As an option, the interferometer, sample chamber and detector areas can all be independently evacuated (as can the IRT-5000/7000 FTIR microscopes)to completely eliminate gases and vapors for the most sensitive sample measurements. The FT/IR-6000 optical benches can also be used in a combination of vacuum and purge for faster sample turn-around.

The FT/IR-6000 has several options for emission port optics with a range of window materials for measurement of external light sources. These can be coupled with customizable collection optics to focus a range of sizes and power outputs of light sources into the interferometer.

Rapid Scan (optional on the 6600 and 6700 and standard on the 6800) offers spectral collection at 20Hz (50msecs).

Step-scan interferometers (optional on all 6000 FTIR instruments) coupled with matching high speed detectors  offers  two different spectral collection rates at either 1 millisecond (1000 Hz) or 10 nanoseconds (100MHz).

System Description

The FT/IR-6000 comprises three basic optical benches utilizing the same Spectra Manager II software platform. Models range from the FT/IR-6600 with a resolution of 0.4 cm-1(S/N 45,000:1) and the FT/IR-6700 with a resolution of 0.25cm-1 (S/N 47,000:1) both with aluminum opticsto the FT/IR-6800 with 0.07cm-1 resolution (S/N 55,000:1)utilizing gold optics.

All instruments includea high output ceramic source, KBrbeamsplitter and DLATGS detector.

The real power of these systems is not only the uncompromising design and the high optical throughput as well as the ability to customize them for virtually any experimental requirement.

System Features

  • A full range of sampling accessories with IQ accessory recognition
  • Vibration-proof optical bench
  • Large sample compartment
  • Retro-reflector (corner-cube) mirrors with auto-alignment to optimize energy throughput
  • Purgeable and vacuumsample compartments and optical bench
  • Detectors from DLATGS, InGaAs, InSb, MCT and He-cooled Bolometers
  • Range of beam splitter materials with either manual or automatic exchange
  • Optional FT-IR microscopy and IR Imaging for both micro and macro measurement
  • Rapid scan and step-scan (microsecond or nanosecond)
  • Wavenumber extension option (25,000 to 10 cm-1)
  • Vibrational Circular Dichroism(VCD) option

Powerful Data Analysis

The FT/IR-6000 Series is controlled by JASCO's proprietary Spectra ManagerTM II cross-platform software. Spectra Manager includes various capabilities including Spectra measurement, Quick-Start, spectral comparison and quantitative analysis as standard functions. The sample measurement screen can be customized according to user requirements and the customized screen and parameters can be saved for future use (User Adaptive Software capability). 

Advanced Measurement Screen of Spectra Manager II 
Advanced Measurement Screen of Spectra Manager II


Measurement parameters and the data acquisition/spectral processing sequence is displayed.

Results display

Data analysis results such as spectral comparison and sample quantification are displayed and readily available.

Real-time monitoring

A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.


Target peak and functional group information can be easily checked using the zoom function.


The measured spectra can be stored as thumbnails within the thumbnail window.

The thumbnails can be individually selected and viewed in Spectra view.

Real-time data processing

Real-time data processing
Before data processing and after data processing (CO2 reduction and H2O correction)

Before start of a sample measurement, the data processing procedures can be verified by checking the results of real-time data processing in a preview window.



FT/IR-6000 Series Specifications

Standard wavenumber measurement range 7,800 to 350 cm-1
Optional extended wavenumber range 25,000 to 10 cm-1
Display wavenumber range 15,000 to 0 cm-1 (standard), 25,000 to 0 cm-1 (optional)
Wavenumber accuracy Within ± 0.01 cm-1 (theoretical value)
Maximum resolution 0.4 cm-1
0.07 cm-1 (optional)
0.25 cm-1
0.07 cm-1 (optional)
0.07 cm-1
Optical System Single beam
Sample chamber Size: 200 mm (W) × 260 mm (D) × 185 mm
Optical path: Center focus, light axis 70 mm high
Interferometer Configuration 28° Michelson interferometer
Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure, DSP control
Vacuum instrument Options available
Mirror coating Aluminum Gold
Drive method Mechanical bearing, electromagnetic drive
Drive speed 0.5, 1, 2, 3, 4, 5, 6, 7,
8 mm/sec
AUTO DLATGS 2.0 mm/sec.
MCT (optional) 4.0 mm/sec.
0.5, 1, 2, 3, 4, 5, 6, 7,
8 mm/sec
AUTO DLATGS 2.0 mm/sec.
MCT (optional) 4.0 mm/sec.
0.125, 0.25, 0.5, 1, 2, 3,
4, 5, 6, 7, 8 mm/sec
AUTO DLATGS 2.0 mm/sec.
MCT (optional) 4.0 mm/sec.
Rapid Scan 20 Hz (optional) 20 Hz (standard)
Beam splitter Substrate material Standard: Ge/KBr
Option: Quartz, Si/CaF2, Ge/CsI, Mylar (interchangeable)
Replacement method Secure-lock beamsplitter catch system
— (Option: Automatic beam splitter exchange system)
Light source Standard: High-intensity ceramic source
Option: Halogen lamp, water-cooled mercury light source
Up to three light sources may be installed simultaneously including external light sourcess
Detector DLATGS (with Peltier temperature control) (standard)
W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs, PAS, Si bolometer (optional)
Two detectors may be mounted simultaneously within the instrument. Up to two external detectors may be installed.
Purging Interferometer, Sample compartment/Detector
Signal-to-noise ratio:
(4 cm-1, 1 min, near 2,200 cm-1)
45,000:1 47,000:1 55,000:1
Gain switching AUTO, 1, 2, 4, 8, 16, 32, 64, 128
100%T line flatness Within 100 ± 1.0%T
(4,000 to 700 cm-1, continuous repetitive measurement)
Communication USB 2.0
FTIR main unit Dimensions: 600 (W) × 670 (D) × 315 (H) mm
Weight:56 kg
Power supply unit Dimensions:200 (W) × 285 (D) × 90 (H) mm, Weight:4.7 kg
This unit can be placed on its base or on its side.

Standard Composition

Parts name Number Remarks
Power supply 1  
Connection cable 1 Cable for connecting the main unit to the power supply
AC cable 1 AC cable for the power supply
USB cable 1 Cable connecting the main unit to the PC
Sample holder 1  
Standard sample 1 Polystyrene film
Stepped pin 2 Used when installing optional accessories into the sample compartment.
Instruction manual 1  
Install Disk 1 Including Spectra ManagerTM II, QAU-4000
Quantitative program and KnowItAll JASCO Edition
Fuse 2  

* CFR Model does not include QAU-4000.



  • Maximum resolution: 0.4 cm-1
  • S/N ratio: 45,000:1



  • Maximum resolution: 0.25 cm-1
  • S/N ratio: 47,000:1



  • Maximum resolution: 0.07 cm-1
  • S/N ratio: 55,000:1

Rapid scan as standardAu-coated mirrors for higher throughputFT-Raman option

Automatic broadband measurement under vacuum condition

Combining the automatic beam splitter exchange unit and the automatic window switching


unit/automatic gate valve unit, a broadband spectral range measurement of a sample can be


provided without breaking the instrument vacuum conditions. The figure demonstrates the


measurement of a carbonate sample by using the ATR PRO ONE with a broadband diamond crystal under instrument vacuum conditions.    


Click one of the FTIR Spectroscopy applications below:

Evaluation of a Si Wafer Surface Using a 65-Degree Incident Angle ATR

Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory

Terahertz (THz) Measurements of Liquids by a Vacuum Compatible ATR Accessory

Rapid Identification of an Illegal Drug using NIR (Identification of MDMA Tablet)

Analysis Example by Vacuum Model FT/IR (2) Analysis of Low Concentration Gas

Secondary Structure Analysis of Proteins Using IR Imaging

Analysis of Automotive Fluids Using with FTIR

Pharmaceutical tablet characterization by NIR Imaging

Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer

Gas Analysis System using Full Vacuum Type FT/IR (Trace amount of H2O in N2 gas)

Quantitative Analysis of Powdered Solids with FTIR-ATR

Secondary Structure Analysis (SSE) Software for Infra Red Interpretation and Modeling of Proteins

Infrared Microscopy for the Analysis of Polymer Laminates in a Juice Bottle


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New Zealand

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New Zealand

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