The FT/IR-6000 is purgeable as standard, to reduce the interference of environmental gases and vapors on the sample spectrum (CO₂ and H₂0 elimination algorithms are also provided). As an option, the interferometer, sample chamber and detector areas can all be independently evacuated (as can the IRT-5000/7000 FTIR microscopes)to completely eliminate gases and vapors for the most sensitive sample measurements. The FT/IR-6000 optical benches can also be used in a combination of vacuum and purge for faster sample turn-around.

The FT/IR-6000 has several options for emission port optics with a range of window materials for measurement of external light sources. These can be coupled with customizable collection optics to focus a range of sizes and power outputs of light sources into the interferometer.

Rapid Scan (optional on the 6600 and 6700 and standard on the 6800) offers spectral collection at 20Hz (50msecs).

Step-scan interferometers (optional on all 6000 FTIR instruments) coupled with matching high speed detectors  offers  two different spectral collection rates at either 1 millisecond (1000 Hz) or 10 nanoseconds (100MHz).

System Description

The FT/IR-6000 comprises three basic optical benches utilizing the same Spectra Manager II software platform. Models range from the FT/IR-6600 with a resolution of 0.4 cm^-1(S/N 45,000:1) and the FT/IR-6700 with a resolution of 0.25cm^-1 (S/N 47,000:1) both with aluminum opticsto the FT/IR-6800 with 0.07cm^-1 resolution (S/N 55,000:1)utilizing gold optics.

All instruments includea high output ceramic source, KBrbeamsplitter and DLATGS detector.

The real power of these systems is not only the uncompromising design and the high optical throughput as well as the ability to customize them for virtually any experimental requirement.

System Features

• A full range of sampling accessories with IQ accessory recognition
• Vibration-proof optical bench
• Large sample compartment
• Retro-reflector (corner-cube) mirrors with auto-alignment to optimize energy throughput
• Purgeable and vacuumsample compartments and optical bench
• Detectors from DLATGS, InGaAs, InSb, MCT and He-cooled Bolometers
• Range of beam splitter materials with either manual or automatic exchange
• Optional FT-IR microscopy and IR Imaging for both micro and macro measurement
• Rapid scan and step-scan (microsecond or nanosecond)
• Wavenumber extension option (25,000 to 10 cm^-1)
• Vibrational Circular Dichroism(VCD) option

Powerful Data Analysis

The FT/IR-6000 Series is controlled by JASCO's proprietary Spectra Manager^TM II cross-platform software. Spectra Manager includes various capabilities including Spectra measurement, Quick-Start, spectral comparison and quantitative analysis as standard functions. The sample measurement screen can be customized according to user requirements and the customized screen and parameters can be saved for future use (User Adaptive Software capability). 

 
Advanced Measurement Screen of Spectra Manager II

Sequence

Measurement parameters and the data acquisition/spectral processing sequence is displayed.

Results display

Data analysis results such as spectral comparison and sample quantification are displayed and readily available.

Real-time monitoring

A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.

Zoom

Target peak and functional group information can be easily checked using the zoom function.

Thumbnail

The measured spectra can be stored as thumbnails within the thumbnail window.

The thumbnails can be individually selected and viewed in Spectra view.

Real-time data processing

Before data processing and after data processing (CO₂ reduction and H₂O correction)

Before start of a sample measurement, the data processing procedures can be verified by checking the results of real-time data processing in a preview window.