FT/IR-6000 Series FTIR Spectrometers

The FT/IR-6000 Series FTIR spectrometers offers an optical bench which can be used (or customized) for a wide range of experimental capabilities from academic research, reverse engineering, R&D to high-end research applications.
The FT/IR-6000 optical bench is based on a 28 degree retro-reflector (corner-cube) mirror Michelson interferometer and designed for absolute flexibility; in its ‘standard’ configuration it has an extensive range of source, beam splitter and detector options from Near-IR to Mid-IR to Far-IR measurements.
Features
The FT/IR-6000 is purgeable as standard, to reduce the interference of environmental gases and vapors on the sample spectrum (CO2 and H20 elimination algorithms are also provided). As an option, the interferometer, sample chamber and detector areas can all be independently evacuated (as can the IRT-5000/7000 FTIR microscopes)to completely eliminate gases and vapors for the most sensitive sample measurements. The FT/IR-6000 optical benches can also be used in a combination of vacuum and purge for faster sample turn-around.
The FT/IR-6000 has several options for emission port optics with a range of window materials for measurement of external light sources. These can be coupled with customizable collection optics to focus a range of sizes and power outputs of light sources into the interferometer.
Rapid Scan (optional on the 6600 and 6700 and standard on the 6800) offers spectral collection at 20Hz (50msecs).
Step-scan interferometers (optional on all 6000 FTIR instruments) coupled with matching high speed detectors offers two different spectral collection rates at either 1 millisecond (1000 Hz) or 10 nanoseconds (100MHz).
System Description
The FT/IR-6000 comprises three basic optical benches utilizing the same Spectra Manager II software platform. Models range from the FT/IR-6600 with a resolution of 0.4 cm-1(S/N 45,000:1) and the FT/IR-6700 with a resolution of 0.25cm-1 (S/N 47,000:1) both with aluminum opticsto the FT/IR-6800 with 0.07cm-1 resolution (S/N 55,000:1)utilizing gold optics.
All instruments includea high output ceramic source, KBrbeamsplitter and DLATGS detector.
The real power of these systems is not only the uncompromising design and the high optical throughput as well as the ability to customize them for virtually any experimental requirement.
System Features
- A full range of sampling accessories with IQ accessory recognition
- Vibration-proof optical bench
- Large sample compartment
- Retro-reflector (corner-cube) mirrors with auto-alignment to optimize energy throughput
- Purgeable and vacuumsample compartments and optical bench
- Detectors from DLATGS, InGaAs, InSb, MCT and He-cooled Bolometers
- Range of beam splitter materials with either manual or automatic exchange
- Optional FT-IR microscopy and IR Imaging for both micro and macro measurement
- Rapid scan and step-scan (microsecond or nanosecond)
- Wavenumber extension option (25,000 to 10 cm-1)
- Vibrational Circular Dichroism(VCD) option
Powerful Data Analysis
The FT/IR-6000 Series is controlled by JASCO's proprietary Spectra ManagerTM II cross-platform software. Spectra Manager includes various capabilities including Spectra measurement, Quick-Start, spectral comparison and quantitative analysis as standard functions. The sample measurement screen can be customized according to user requirements and the customized screen and parameters can be saved for future use (User Adaptive Software capability).

Advanced Measurement Screen of Spectra Manager II
Sequence
Measurement parameters and the data acquisition/spectral processing sequence is displayed.
Results display
Data analysis results such as spectral comparison and sample quantification are displayed and readily available.
Real-time monitoring
A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.
Zoom
Target peak and functional group information can be easily checked using the zoom function.
Thumbnail
The measured spectra can be stored as thumbnails within the thumbnail window.
The thumbnails can be individually selected and viewed in Spectra view.
Real-time data processing

Before data processing and after data processing (CO2 reduction and H2O correction)
Before start of a sample measurement, the data processing procedures can be verified by checking the results of real-time data processing in a preview window.
FT/IR-6000 Series Specifications
Model | ||||
Standard wavenumber measurement range | 7,800 to 350 cm-1 | |||
Optional extended wavenumber range | 25,000 to 10 cm-1 | |||
Display wavenumber range | 15,000 to 0 cm-1 (standard), 25,000 to 0 cm-1 (optional) | |||
Wavenumber accuracy | Within ± 0.01 cm-1 (theoretical value) | |||
Maximum resolution | 0.4 cm-1 0.07 cm-1 (optional) |
0.25 cm-1 0.07 cm-1 (optional) |
0.07 cm-1 | |
Optical System | Single beam | |||
Sample chamber | Size: 200 mm (W) × 260 mm (D) × 185 mm Optical path: Center focus, light axis 70 mm high |
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Interferometer | Configuration | 28° Michelson interferometer Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure, DSP control |
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Vacuum instrument | Options available | |||
Mirror coating | Aluminum | Gold | ||
Drive method | Mechanical bearing, electromagnetic drive | |||
Drive speed | 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLATGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. |
0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLATGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. |
0.125, 0.25, 0.5, 1, 2, 3, 4, 5, 6, 7, 8 mm/sec AUTO DLATGS 2.0 mm/sec. MCT (optional) 4.0 mm/sec. |
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Rapid Scan | 20 Hz (optional) | 20 Hz (standard) | ||
Beam splitter | Substrate material | Standard: Ge/KBr Option: Quartz, Si/CaF2, Ge/CsI, Mylar (interchangeable) |
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Replacement method | Secure-lock beamsplitter catch system — (Option: Automatic beam splitter exchange system) |
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Light source | Standard: High-intensity ceramic source Option: Halogen lamp, water-cooled mercury light source Up to three light sources may be installed simultaneously including external light sourcess |
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Detector | DLATGS (with Peltier temperature control) (standard) | |||
W-MCT, M-MCT, N-MCT, Si, InSb, InGaAs, PAS, Si bolometer (optional) Two detectors may be mounted simultaneously within the instrument. Up to two external detectors may be installed. |
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Purging | Interferometer, Sample compartment/Detector | |||
Signal-to-noise ratio: (4 cm-1, 1 min, near 2,200 cm-1) |
45,000:1 | 47,000:1 | 55,000:1 | |
Gain switching | AUTO, 1, 2, 4, 8, 16, 32, 64, 128 | |||
100%T line flatness | Within 100 ± 1.0%T (4,000 to 700 cm-1, continuous repetitive measurement) |
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Communication | USB 2.0 | |||
FTIR main unit | Dimensions: 600 (W) × 670 (D) × 315 (H) mm Weight:56 kg |
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Power supply unit | Dimensions:200 (W) × 285 (D) × 90 (H) mm, Weight:4.7 kg This unit can be placed on its base or on its side. |
Standard Composition
Parts name | Number | Remarks |
Power supply | 1 | |
Connection cable | 1 | Cable for connecting the main unit to the power supply |
AC cable | 1 | AC cable for the power supply |
USB cable | 1 | Cable connecting the main unit to the PC |
Sample holder | 1 | |
Standard sample | 1 | Polystyrene film |
Stepped pin | 2 | Used when installing optional accessories into the sample compartment. |
Instruction manual | 1 | |
Install Disk | 1 | Including Spectra ManagerTM II, QAU-4000 Quantitative program and KnowItAll JASCO Edition |
Fuse | 2 |
* CFR Model does not include QAU-4000.
Details

FT/IR-6600
- Maximum resolution: 0.4 cm-1
- S/N ratio: 45,000:1

FT/IR-6700
- Maximum resolution: 0.25 cm-1
- S/N ratio: 47,000:1

FT/IR-6800
- Maximum resolution: 0.07 cm-1
- S/N ratio: 55,000:1
Rapid scan as standardAu-coated mirrors for higher throughputFT-Raman option
Automatic broadband measurement under vacuum condition
Combining the automatic beam splitter exchange unit and the automatic window switching
unit/automatic gate valve unit, a broadband spectral range measurement of a sample can be
provided without breaking the instrument vacuum conditions. The figure demonstrates the
measurement of a carbonate sample by using the ATR PRO ONE with a broadband diamond crystal under instrument vacuum conditions.
Applications
Evaluation of a Si Wafer Surface Using a 65-Degree Incident Angle ATR
Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
Terahertz (THz) Measurements of Liquids by a Vacuum Compatible ATR Accessory
Rapid Identification of an Illegal Drug using NIR (Identification of MDMA Tablet)
Analysis Example by Vacuum Model FT/IR (2) Analysis of Low Concentration Gas
Secondary Structure Analysis of Proteins Using IR Imaging
Analysis of Automotive Fluids Using with FTIR
Pharmaceutical tablet characterization by NIR Imaging
Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer
Gas Analysis System using Full Vacuum Type FT/IR (Trace amount of H2O in N2 gas)
Quantitative Analysis of Powdered Solids with FTIR-ATR
Secondary Structure Analysis (SSE) Software for Infra Red Interpretation and Modeling of Proteins
Infrared Microscopy for the Analysis of Polymer Laminates in a Juice Bottle
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