The real advantage of the FT/IR-8X, is not just the uncompromising design and high optical throughput, but the quality of results that can be achieved with this system.
FT/IR-8X is JASCO’s most advanced FTIR spectrometer, to date with an excellent signal-to-noise ratio (55,000 : 1) and the highest resolution (0.07 cm-1).
The 8X is a highly configurable optical system is applicable to virtually any FTIR application, from simple Mid IR measurement to much more complex analysis in the near and far IR. Research-based measurements are easily performed using the FT/lR-8X spectrometers with options such as emission port optics, external detectors, full-vacuum, step scan and FT-Raman.
User-exchangeable components combined with full automation make it possible to perform spectral measurement from 25,000 cm-1 to less than 20 cm-1 without touching the system.
User exchangeable beam splitters and windows
Expandable Wavelength Range
The standard spectrometer uses Ge/KBr beam-splitter with KRS-5 windows and a DLaTGS detector (also with KRS-5 window) for a spectral range 7,800 to 350 cm-1. There is a wide range of options to select part or all of the spectral range from 25,000 to 20 cm-1, including fully automated beam-splitter and window exchange for unattended operation. With the widest choice of optical materials, a wide spectral range can be covered using a minimum number of components including a combination of new broad-band beam splitter, window and detector materials covering the Mid-IR to Far-IR
Nitrogen Purge and Evacuation
A multi-zone N2 purge system is included as standard to minimize the interference from environmental gases and vapors (CO2 and H20 elimination algorithms are also included). The interferometer, sample chamber and detector areas can all be independently evacuated in a full or partial vacuum instrument (useful for fast sample loading) to completely eliminate CO2 and H20 for the most sensitive sample measurements, and as the moving mirror does not rely on an air-bearing, the vacuum can easily be maintained.
Emission Ports and External Light Measurement and Characterization
The FT/IR-8X has several options for optical ports with a range of window materials for measurement of external sources of light and black body devices. A collimated beam can be brought out of the instrument for measurement in external sample compartments.
Rapid Scan and Step Scan
Rapid Scan offers spectral collection up to 40Hz. Step-scan (option for the 8X) coupled with matching high speed pv-MCT detectors offers two different spectral collection rates at either 1 millisecond (1000 Hz) or 10 nanoseconds (100MHz). Using Amplitude or Phase modulation and Time Resolved with photo-acoustic detection.
- FT/IR-8X – gold coated optics
- All instruments include a high output ceramic source, Ge/KBr beam splitter and DLaTGS detector.
- HeNe timing laser
- Emission port optics for black body measurement, external light characterization etc.
- A full range of sampling accessories with IQX accessory recognition
- Vibration-proof optical bench
- Large sample compartment
- Retro-reflector (corner-cube) mirrors with auto-alignment to optimize energy throughput
- Purgeable and vacuum sample compartment and optical bench
- Detectors from photo diodes, DLaTGS, InGaAs, InSb, MCT and He-cooled Bolometers
- Range of beam splitter materials with either manual or automatic exchange
- Optional FTIR microscopy and IR Imaging for both micro and macro measurement
- Rapid scan and step-scan (microsecond or nanosecond)
- Wavenumber expansion options (25,000 to 10 cm-1)
- Vibrational Circular Dichroism(VCD) option
- FT-Raman option
Powerful Data Analysis with Spectra Manager Suite 2.5
The FT/IR-8X is controlled by Spectra Manager™ cross-platform software. Spectra Manager™ includes Spectra measurement, Quick-Start, spectral comparison and quantitative analysis as standard functions. Library search and analysis with KnowItAll Informatics JASCO Edition.
The sample measurement screen can be customized according to user requirements and the customized screen and parameters can be saved for future use (User Adaptive Software capability).
Advanced Measurement Screen of Spectra Manager™
Measurement parameters and data acquisition/spectral processing sequence are displayed.
Data analysis results such as spectral comparison and sample quantification are displayed and readily available.
A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.
Target peak and functional group information can be easily checked using the zoom function.
The measured spectra can be stored as thumbnails within the thumbnail window. The thumbnails can be individually selected and viewed in Spectra view.
Real-Time Data Processing
Before start of a sample measurement, the data processing procedures can be verified by checking the results of real-time data processing in a preview wind
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