The real advantage of the FT/IR-6X is not just the uncompromising design and high optical throughput, but also the ability to customize them for virtually any experimental requirement.
The FT/lR-6X FTIR spectrometers with 28 degree Michelson interferometer and diode timing laser is an excellent choice for more demanding research applications, where better polarization performance or a more flexible approach to samples and measurement are required.
The configurable optical system applicable to virtually any FTIR application, from simple Mid IR measurement to more complex analysis in the near and far IR. Research-based measurements are easily performed using the FT/lR-6X or FT/lR-8X spectrometers with options such as full-vacuum, gold-coated optics, rapid & step scan and FT-Raman.
User-exchangeable components combined with full automation make it possible to perform spectral measurement from 25,000 cm-1 to less than 20 cm-1 without touching the system. The FT/lR-6X and FT/lR-8X spectrometers are compatible with a range of vacuum and configurable emission ports to perform experiments outside the sample compartment, and are also compatible with the comprehensive range of IR microscopes.
FT/IR-6X FTIR Spectrometer
FT/lR-6X is an ideal FTIR spectrometer for research applications, with an excellent signal-to-noise ratio (47,000 : 1) . The measurement wavenumber range can be configured from 25,000 to 20 cm-1 and high resolution (0.25 cm-1.
The standard spectrometer uses Ge/KBr beam-splitter with KRS-5 windows and a DLaTGS detector with KRS-5 window, spectral range 7,800 to 350 cm-1. There are a wide range of options to change the spectral range from 25,000 to 10 cm-1, including fully automated beam-splitter and window exchange for unattended operation. With the widest choice of materials, a wide spectral range can be covered using a minimum number of components including a combination of new broad-band beam splitter, window and detector materials covering the Mid-IR to Far-IR
Nitrogen Purge and Evacuation
A multi-zone N2 purge system is standard . This can be used to minimize the interference from environmental gases and vapors (CO2 and H20 elimination algorithms are also included). Available as an option, the interferometer, sample chamber and detector areas can all be independently evacuated in a full or partial vacuum instrument (useful for fast sample loading) to completely eliminate CO2 and H20 for the most sensitive sample measurements and as the moving mirror does not rely on an air-bearing, the vacuum can easily be maintained.
Emission Ports and Light Introduction
The FT/IR-6000 has several options for optical ports with a range of window materials for measurement of external sources of light and black body devices..
Optional Rapid Scan offers spectral collection at up to 40Hz.
6X System Features
- Aluminum optics
- Long life VCSEL laser diode (HeNe as an option)
- High output ceramic source, Ge/KBr beam splitter and DLaTGS detector.
- Emission port optics for black body measurement, external light characterization etc.
- A full range of sampling accessories with IQX accessory recognition
- Vibration-proof optical bench
- Large sample compartment
- Corner-cube mirrors with auto-alignment to optimize energy throughput
- Purgeable and vacuum sample compartment and optical bench
- Optional detectors include – photo diodes, DLaTGS, InGaAs, InSb, MCT and He-cooled Bolometers
- Range of beam splitter materials with either manual or automatic exchange
- Optional FTIR microscopy and IR Imaging for both micro and macro measurement
- Rapid scan
- Wavenumber extension option (25,000 to 20 cm-1)
- Vibrational Circular Dichroism(VCD) option
Powerful Data Analysis with Spectra Manager Suite 2.5
The FT/IR-6X is controlled by Spectra Manager™ cross-platform software. Spectra Manager™ includes Spectra measurement, Quick-Start, spectral comparison and quantitative analysis as standard functions. Library search and analysis with KnowItAll Informatics JASCO Edition.
The sample measurement screen can be customized according to user requirements and the customized screen and parameters can be saved for future use (User Adaptive Software capability).
Advanced Measurement Screen of Spectra Manager™
Measurement parameters and data acquisition/spectral processing sequence are displayed.
Data analysis results such as spectral comparison and sample quantification are displayed and readily available.
A real-time data processing function can be used to verify the current spectrum during measurements. Spectra stored in thumbnails can also be overlaid with the current spectrum during sample measurements.
Target peak and functional group information can be easily checked using the zoom function.
The measured spectra can be stored as thumbnails within the thumbnail window. The thumbnails can be individually selected and viewed in Spectra view.
Real-Time Data Processing
Before start of a sample measurement, the data processing procedures can be verified by checking the results of real-time data processing in a preview window.
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