FTIR Microscopes
An Overview of the FT/IR-5000 and FT/IR-7000 Series of FTIR Microscopes
System Features
- Transmission and Reflection with a choice of magnifications
- ATR measurement with many prism options including ‘view through’ options
- High optical throughput using high quality reflective components
- Wide wavenumber range 15,000 to 400 cm-1
- Excellent signal to noise ratio with a range of MCT and other detectors including electrically cooled DLaTGS.
- Linear Array detector (16 elements, wavenumber range 7,000 to 650 cm-1) for fast imaging analysis and kinetics measurement
- High spatial resolution
- Full vacuum option for sensitive measurement without noise from environmental gases
- IQ Mapping for in-situ mapping experiments for high speed or samples that can be easily damaged when the ATR is moved
- Rapid IR Imaging experiments for kinetics using Rapid Scan
- Spectra Manager Imaging Suite – a fast an powerful interface for mapping and imaging
- Up to four objectives with automatic switching
- Exceptional visual observation quality with DIC and polarization options
- Wide area mapping and multi-ATR imaging
- Dynamic Imaging with Rapid Scan and Step-Scan options
- Multivariate analysis PCA
IRT-5000 Microscope
JASCO has developed the IRT-5000, an innovative FT-IR microscope accessory with advanced functionality which...
IRT-7000 Microscope
JASCO introduces the IRT-7000, an innovative FT-IR multi-channel microscope accessory with advanced functionality which...
IRT-1000 Microscope
The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 series...
FTIR Imaging Application Notes
FARIS-1
Submillimeter wave exclusive Fourier transform spectrophotometer
Request Information
Call us for more information on 0800 773 274 or email info@specsci.nz or simply use the contact form below and one of our technical specialists will contact you directly to discuss your needs.
Features
Coupling JASCO’s proven technology for infrared spectroscopy, accumulated over 50 years, with the most advanced optical design, the IRT-5000/7000 Series offer the best solution for even the most challenging sample analyses.
System Features
- High optical throughput
- Excellent signal to noise ratio
- High spatial resolution
- Operational flexibility
- Expandable capabilities
- Full range of accessories
FTIR Microscope Specifications
| Principle | FT-IR microscope with cassegrain optical system |
| Measurement Method | Transmittance / Reflectance measurement |
| Standard Detector | IRT-5100: DLATGS detector (7800-400 cm -1 ) IRT-5200 & IRT-7100: Single mid-band MCT (7800-600 cm -1 ) IRT-7200: Linear array MCT (7000-650 cm -1 x 16 element) Single mid-band MCT (7800-600 cm) -1 |
| Detector exchange | Dual detector capability (software controlled), user exchangeable single element detectors are available as an option. |
| Optional Detectors | Single element detector (IRT-5100): - Narrow-band: MCT (5000-750 cm -1 ) - Mid-band: MCT (7800-600 cm -1 ) - Wide-band: MCT (7800-450 cm -1 ) - InSb: (15000-1850 cm -1 ) - InGaAs detector: (12000-4000 cm -1 ) Single element detector (IRT-5200, IRT-7100, & IRT-7200): Linear array detector (IRT-5200, IRT-7100): Linear array detector (IRT-7200): |
| S/N Ratio | Single element detector (IRT-5100): - 1000:1 (Aperture size 300 μm 2 , resolution 4 cm -1 , 1 min. acquisition, near 2200 cm -1 , p-p) Single element detector (IRT-5200, IRT-7100, & IRT-7200): Linear array detector (IRT-7200): |
| Microscope objectives | IRT-5100, IRT-5200, & IRT-7100: - Cassegrain: 16 x 32 x or 10 x - Automatic objective recognition function (standard) - Up to four objectives can be selected by the software. IRT-7200: |
| Condenser mirror | IRT-5100, IRT-5200, & IRT-7100: - Cassegrain: 16 x 32 or 10 x (manual exchange) - Automatic condenser mirror recognition function (standard) IRT-7200: |
| Condenser mirror compensation | Standard auto-compensation function |
| Aperture | PC-controlled vertical horizontal adjustment and angle of rotation |
| Sample Storage | Standard (IRT-5100 & IRT-5200): - Manual stage with fine adjustment (Movable distance: X: 70, Y: 50, Z: 20 mm) Standard (IRT-7100 & IRT-7200): Option (IRT-5100 & IRT-5200): Option (IRT-7100 & IRT-7200): |
| Auto focus | Option (IRT-5100 & IRT-5200) Standard (IRT-7100 & IRT-7200) |
| IQ Mapping | Standard (IRT-7100 & IRT-7200) |
| Sample Observation | High-resolution, 3 Megapixel CMOS camera with a 3X optional zoom function (standard) IQ Monitor (simultaneous sample measurement and observation) and auto illumination function (standard) 5.7 inch integrated color LCD display (option), Binocular (option) |
| Observation Options | Visible polarization observation, Differential interference contrast observation, Fluorescence observation Refractive objectives: 10×, 20× |
| Microscope Objectives | Cassegrain 16× - standard; 10×, 32× - optional Automatic objective recognition function is standard. Up to four objectives can be selected by the software. |
| ATR Measurement (option) | "Clear-View" ATR objective (ATR-5000-SS/SD/SG) *1 , conventional ATR objective (ATR-5000-D/Z/G) *1 , Stage-mounted micro ATR using transmittance light path (ATR-5000-TPZ) |
| Grazing Angle Measurement (option) | Cassegrain grazing angle objective (RAS-5000) *2 |
| Purge | Sample area purge case is optional as an option. |
| Integrated Control Panel | Transmittance/Reflection switching with indicator; detector indicator; objective selection/indicator; open/close and rotation of aperture; auto-compensation of condenser mirror; visible illumination adjustment |
| Dimension | IRT-5100 & IRT-5200: 587 (H) × 302 (W) × 695 (D) mm, 54 kg IRT-7100 & IRT-7200: |
| Power Consumption | IRT-5100 & IRT-5200: AC 100-240 V, 50/60 Hz, max. 60 VA IRT-7100 & IRT-7200: |
*1 Pressure sensor (PRS-M-5000, PRS-A-5000) is required.
*2 Infrared polarizer (PL-IR-5000, PL-IR-7000) is required.
Details
FT-IR Micro-Area Analysis - IQ Mapping
JASCO's new FT-IR microscope systems feature an innovative capability for sample analysis, "IQ Mapping". This function enables automated multi-point mapping, line mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector. The microscope system automatically scans the specified points or area, rapidly collecting a full spectrum of each point without moving the sample stage. The IQ Mapping function can provide a measurement of a maximum area of 400 µm square using the 16× Cassegrain objective. The combination of IQ Mapping with the automated XYZ stage provides a wide area analysis capability.
IQ Mapping
- Single point
- Multi-point
- Line Mapping
- Grid Mapping
- Micro-ATR Mapping
IQ Mapping with automatic X-Y-Z stage
- Wide-area Mapping
- Multi-ATR Mapping
Linear array detector and rapid scan
- IR Imaging
- Linear array detector and step scan
- Dynamic Imaging
Sampling Flexibility
A wide range of data acquisition modes provides the best solution for almost any type of sample and application.
Exceptional visual observation quality
All microscopes are equipped with a high-resolution CMOS video camera with a 3× optical zoom capability, which allows high quality sample observation. Digital zoom function is also available for sample visualization at much higher magnification.
The world's first cross platform software
A full-featured software package, Spectra Manager II provides convenient, and/or automatic functions and simplified operational procedures to minimize manual operations. Powerful data processing functions include 2-D and/or 3-D visualization of chemical information with all standard manipulation of spectral data.
- Superior user-friendly graphical interface
- Auto-focus/Auto-illumination
- Registration of commonly used aperture settings
- Automatic recognition of microscope objectives
- Thumbnail display (Memorizing the sample position with focus and aperture information)
- Spectrum preview to check conditions before measurement
- IQ Monitoring for simultaneous observation of the spectrum and sample image
- Data storage linked with sample image and aperture information
- Report publishing capability (JASCO Canvas)
Expandability
A wide range of optional accessories is available. The microscope system can be optimized for sample application requirements.
- 5.7 inch TFT color display or Binocular
- Joystick for automated stage control
- Wavelength extension options
- ATR objectives and pressure sensor
- Grazing angle objective and IR polarizer
- Sample purge and vacuum options
- Sample observation options(Visible polarizer, Fluorescence observation andrefractive objectives (10×, 20×)
Contact Details
Phone: 0800 773 274
Email: info@specsci.nz
Postal Address
PO Box 17720
Christchurch 8840
New Zealand
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