Spectrometer Specification
Model | FP-8200 | FP-8300 | FP-8500 | FP-8600 | FP-8700 |
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Light Source | Continuous output Xe arc lamp with shielded lamp housing (150 W) | ||||
Light Source (for validation) | Integrated, selectable low pressure mercury lamp | ||||
Photometric System | Radio-photometer system using monochromatic light to monitor the intensity output of the Xe lamp | ||||
Monochromator | Holographic concave grating in modified Rowland mount | ||||
Wavelength Range (with Standard Detector) | |||||
Ex | Zero order, 200 - 750 nm | Zero order, 200 - 850 nm | Zero order, 200 - 850 nm |
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Em | Zero order, 200 - 1010 nm | Zero order, 300 - 1400 nm |
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Wavelength Range (Optional) | Zero order, 200 - 900 nm | Zero order, 200 - 850 nm | N/A | option 1700nm | |
Automatic Cut Filters for High Order Diffraction | Option | Standard | |||
Sensitivity *1 (RMS) | |||||
Peak *2 | 380 : 1 | 680 : 1 | 1,200 : 1 | 600 : 1 | |
Base *3 | 4,500 : 1 | 2,800 : 1 | 8,500 : 1 | 3,500 : 1 | 1400 nm - 8,000:1 1700 nm - 1,000:1 |
Resolution | |||||
Ex | 2.5 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | |
Em | 2.5 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 2.0 nm (at 546.1 nm) | |
Band Width | |||||
Ex | 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20, L5, L10 nm | 1, 2.5, 5, 10, 20, L5, L10 nm | |
Em | 2.5, 10, 20, 40, L10, L20 nm | ||||
Wavelength Accuracy | |||||
Ex | ±2.0 nm | ±1.5 nm | ±1.0 nm | ±1.0 nm | |
Em | ±2.0 nm | ||||
Wavelength Repeatability | |||||
Ex | ±1.5 nm | ±1 nm | ±0.3 nm | ±0.3 nm | |
Em | ±0.6 nm | ||||
Wavelength Scan Speed | |||||
Ex | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min |
10, 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000 nm/min |
10, 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000 nm/min | ||
Em | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000, 120,000 nm/min | ||||
Slew Speed | |||||
Ex | 30,000 nm/min | 60,000 nm/min | 60,000 nm/min | ||
Em | 30,000 nm/min | 120,000 nm/min | |||
Response | 20, 50, 100, 200, 500 msec, 1, 2, 4, 8 sec |
10, 20, 50, 100, 200, 500 msec, 1, 2, 4, 8 sec | |||
Detector | Ex: Silicon photodiode, Em: PMT | Ex: Silicon PD, Em: LN2 Cooled PMT | |||
Photometric Range | -10,000 - 10,000 | ||||
Sensitivity Selection | High, Medium, Low, Very Low, Manual, Auto SCS | ||||
Auto Gain | Standard | ||||
Shutter Function | Standard (Automatic control) | ||||
Sample Illuminating System | Horizontal illumination | ||||
Sample Compartment | 10 mm rectangular cell holder, nitrogen purgeable | ||||
Recognition of IQ Accessory | Standard | ||||
Start Button | Standard | ||||
Analog Output | Standard | ||||
Instrument Communication | USB 2.0 | ||||
Control and Data Processing | Spectra Manager™/CFR, iRM | Spectra Manager™/CFR | |||
Spectral Correction | Option | Standard (Spectral correction using a Rhodamine B ethylene glycol solution is standard; other jigs for spectral correction are available separately as options.) |
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Dimensions | 490(W) × 545(D) × 270(H) mm | 520(W) × 545(D) × 270(H) mm | 570(W) × 545(D) × 270(H) mm | ||
Weight | 33.6 kg (74 lbs) | 36 kg (79 lbs) | 39 kg (86 lbs) | 40 kg (88 lbs) | |
Power Requirement | 270VA | ||||
Installation Environment | Temperature: 15 to 35°C, Humidity: Less than 85% |
*1 : Minimum Signal-to-Noise ratio of Raman band of water, excitation 350 nm, band width Ex 5 nm Em 5 nm (FP-8600: Ex 5 nm Em 10 nm), response 2 seconds.
*2 : Noise is measured on the Raman peak.
*3 : Noise is measured on the baseline.
Software Specification
A wide range of software applications and accessories can be used with Spectra Manager™ Suite.
Model | FP-8200 | FP-8300 | FP-8500 | FP-8600 |
---|---|---|---|---|
Data Station Type | Spectra Manager™/Spectra Manager™ CFR (Microsoft Windows® 7 or 8.1 Professional) | |||
iRM Type | Handheld Intelligent Remote Module iRM-900 | N/A | ||
Measurement Programs | ||||
Spectra Manager™ |
Spectra measurement, Quantitative measurement, Fixed wavelength measurement, Time course measurement, 3-D Spectra measurement, Abs measurement |
Spectra measurement, Quantitative measurement, Fixed wavelength measurement, Time course measurement, 3-D Spectra measurement, Abs measurement, Phosphorescence measurement |
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Spectra Manager™ CFR *4 | ||||
iRM-900 *5 | Spectra measurement, Quantitative measurement, Fixed wavelength measurement, Time course measurement, 3D Spectra measurement, Abs measurement | N/A | ||
Spectra Correction Program | Standard *6 | Standard | ||
Instrument Validation | Program and Hg lamp (Standard), Accessories (option) | Program and Hg lamp (Standard), Accessories (Standard) | ||
Self Diagnosis | Standard | |||
IQ Accessory Recognition and IQ Start | Standard |
*4 : Spectra Manager™ CFR is the 21 CFR Part 11 compliant software package.
*5 : The iRM-900 handheld control module can be used with any PictBridge compatible printer.
*6 : Optional components are necessary.
Specifications are subject to change without notice.
High speed 3D spectral measurement with the highest class wavelength scanning speed
3D spectra measurement is available for all models of the FP-8000 series. The analysis software offers a variety of processing methods to easily display the relevant data characteristics.

3D fluorescence spectrum of quinine sulfate

Fluorescence 3D spectrum of erbium oxide

NIR three-dimensional fluorescence spectrum of single-walled carbon nanotube
Request Information
Call us for more information on 0800 773 274 or email info@specsci.nz or simply use the contact form below and one of our technical specialists will contact you directly to discuss your needs.
Details
Highest S/N performance
The high S/N (signal-to-noise) performance of the FP-8000 series is achieved by a high throughput optical system and low-noise signal processing.
8500:1 or greater (RMS, FP-8500)
Spectra of fluorescein solutions
Wide Dynamic Range using Auto-Gain and Auto-SCS
A wide dynamic range for luminescence measurements is obtained using the Auto-Gain and Auto-SCS features, automatically adjusting the detector sensitivity for optimum measurements.
Auto-SCS
Effective for fixed wavelength measurements and quantitative analysis, Auto-SCS makes it possible to create the calibration curve for a wide range of concentrations without modifying the instrument measurement parameters.
Calibration curve of fluorescein solutions
Auto-Gain
Collecting data with an optimized S/N throughout the entire scan range for spectra or time course measurements is obtained with ease using the Auto-Gain feature, automatically adjusting the gain due to fluorescence intensity.
Spectra of quinine sulfate solution
Automatic higher-order diffraction cut filter
The conventional method for removing higher-order diffraction artifacts from excitation/emission spectra involves selection and installation of the proper cut filters according to the scanning wavelengths. The automatic cut filter system of the FP-8000 series (option for FP-8200) selects the proper cut-off filters for spectral measurements to obtain spectra without higher-order diffraction interference.
Spectra of fluorescent orange color plate
3D Spectra Measurement
3D spectra measurement is available for all models of the FP-8000 series. The fastest scan speed of 120,000 nm/min for the FP-8500 offers 3D spectral measurement in the shortest time available for any instrument in this class. The analysis software offers a variety of processing methods to easily display the relevant data characteristics.
3D spectra measurement of fluorescent orange color plate
Phosphorescence measurement
A high-speed chopper for the FP-8300, 8500 and 8600 instruments offers phosphorescence spectrum measurements as well as advanced phosphorescent lifetime and quantitative analysis measurements.
Luminescence spectra of cooled Benzene
The luminescence spectra of benzene measured with 255 nm excitation at 77 K. The blue trace in the figure is the normal emission spectrum; the red trace is the phosphorescence spectrum measured using a 5 msec delay.
IQ Accessories (automatic accessory identification)
The FP-8000 IQ accessories utilize a non-contact RFID sensor for automatic recognition by the control software. Accessory information, including accessory name and serial number, is retrieved and saved in the spectral data file. The IQ Start function can be programmed to automatically select a specified control program for simplified sample measurements.
IQ accessory identification using a non-contact sensor (RFID)
An abundance of Special Accessories and Programs
A wide variety of accessories and control/analysis programs are designed to integrate analysis methods for various samples and application requirements ranging from biochemical/bioscience to materials research and beyond.
A variety of optimized accessories
Accessories














































Request Information
Call us for more information on 0800 773 274 or email info@specsci.nz or simply use the contact form below and one of our technical specialists will contact you directly to discuss your needs.
Contact Details
Phone: 0800 773 274
Email: info@specsci.nz
Postal Address
PO Box 17720
Christchurch 8840
New Zealand
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