The V-7000 series is a high-end ultraviolet-visible near-infrared spectrophotometer with linearity up to absorbance 8 due to its outstanding optical system and signal processing electronics technology. By installing a retrow type double monochromator, ultra-low stray light of 0.00007% or less is realized. In addition, the throughput of the entire optical system is increased by the optical system that effectively collects the light from the light source and incidents it on the spectroscope. Taking advantage of this performance, the V-7000 series can measure the optical characteristics of optical materials and advanced materials with high accuracy.
Ultra-low stray light design with double monochromator
By installing a retrow type double monochromator, ultra-low stray light of 0.00007% or less has been achieved. In addition, we have designed an optical system that effectively collects the light from the light source and incidents it on the spectroscope, increasing the throughput of the entire optical system.
World-class wide metering range
An ultra-high performance spectrophotometer with linearity up to absorbance 8.
Achieves high resolution of wavelength resolution 0.049 nm
The wavelength resolution of the V-7000 series in the ultraviolet-visible region has a very high resolution of 0.049 nm or less. This makes it possible to measure high resolution.
V-7100: High-precision UV-visible model
- Wavelength range: 185-900 nm
- High-sensitivity measurement in the ultraviolet-visible region is possible
V-7200: Covers a wide range of UV-visible and near-infrared regions
- Wavelength range: 185 to 3300 nm
- Can measure up to 3300 nm, which is the mid-infrared region
V-7300: High-sensitivity model capable of measuring ultraviolet-visible and near-infrared regions
- Wavelength range: 185 to 1800 nm
- InGaAs with excellent resolution is used for the near-infrared detector
- Can be measured with high S / N in the near infrared region
Highly linear measurement is possible over a wide wavelength range
The V-7000 series of high-spec spectrophotometers achieves the world's top class photometric range of ± 8.0 Abs.
The spectrum measured by measuring one of each of the two types of optical filters and the spectrum measured by superimposing the two types are shown. The spectrum measured by overlapping the two types matches the sum of the values measured one by one for the two types in a very wide wavelength range and metering range. From this, you can see the wide metering range and high linearity.
Achieves high resolution of wavelength resolution 0.049 nm
The wavelength resolution of the V-7000 series in the ultraviolet-visible region has a very high resolution of 0.049 nm or less. This makes it possible to measure high resolution.
The emission line of the mercury lamp was measured. Looking at the half width at the emission line of 296.73 nm, it shows 0.040 nm or less. It is useful for measurements that require decomposition, such as evaluation of bandpass filters, notch filters, and cut filters.
High-precision measurement with high linearity
Spectral measurements of Co (NO 3 ) 2 aqueous solutions of various concentrations were performed and calibration curves were created from absorption at 511 nm. It can be seen that it is possible to measure linearly from a low concentration with an absorbance of 0.05 or less to a high concentration with an absorbance of over 6.
Pigment spectrum measured with φ1 mm mask
The integrating sphere unit is suitable for measuring the diffuse reflection of solid samples and powder samples, and for measuring the diffuse transmission of frosted glass samples and suspensions. The integrating sphere unit for the V-7000 series is available in a fixed luminous flux size model and a light-collecting model. The light-collecting model is designed to focus on both transmission and reflection measurement sample positions, enabling highly accurate measurement of even minute parts.
Using the condensing model of the integrating sphere unit, the measurement light was narrowed down to φ1 mm, and the three color pigments of blue, yellow, and red were measured. A low noise spectrum can be obtained even in a small measurement area.
Absolute reflectance spectrum of dichroic mirror
The absolute reflectance measurement unit for the V-7000 series controls the sample stage and detector from a PC, and automates the variable angle measurement of the incident angle and the light receiving angle. It is possible to continuously measure the absolute reflectance spectrum at multiple incident / light receiving angles. With a built-in PC-controlled polarizer, it is possible to perform variable angle measurement for S and P polarized light, which is effective for evaluating optical elements and materials.
The figure below shows an example of measuring the reflection spectrum of a dichroic mirror while changing the angle of incidence. The shape of the spectrum is highly dependent on the angle of incidence. In addition, changes can be seen due to the difference between S-polarized light and P-polarized light of the incident light.
V-7100 / 7200/7300
|
Model name
|
V-7100 | V-7200 | V-7300 |
|---|---|---|---|
|
Optical system
|
Three-dimensional arrangement retrow type mount double monochrome double beam method | ||
|
light source
|
Deuterium lamp, tungsten halogen lamp, mercury lamp (for validation) | ||
|
Wavelength range
|
185-900nm | 185-3300nm | 185-1800nm |
|
Disassembly
|
0.049nm or less (UV / VIS) | 0.049nm or less (UV / VIS) 0.2nm or less (NIR) |
0.049nm or less (UV / VIS) 0.1nm or less (NIR) |
|
Wavelength accuracy
|
± 0.08nm (190-800nm) | ± 0.08nm ( 190-800nm ) ± 0.40nm (800-3000nm) |
± 0.08nm ( 190-800nm ) ± 0.20nm (800-1700nm) |
|
Metering range
|
+/- 8.0 Abs | ||
|
Light source
|
High-brightness ceramic light source Halogen lamp, water-cooled high-pressure mercury light source |
||
|
Metering accuracy
|
0.00028Abs (0.3Abs, UV / VIS) Double aperture used | ||
|
Baseline stability
|
0.0002 Abs / Hr or less | ||
|
Baseline flatness
|
± 0.0012Abs (200-850nm)
|
± 0.0012Abs (200-3000nm) | ± 0.0012Abs (200-1700nm) |
| Stray light | 0.00007% or less 220nm (10g / L NaI ASTM) 0.00007% or less 370nm (50g / L NaNO 2 ) |
0.00007% or less 220 nm (10 g / L NaI ASTM) 0.00007% or less 370 nm (50 g / L NaNO 2 ) 0.0003% or less 1420 nm (H 2 O pathlength 1 cm) 0.00048% or less 2365Nm (CHCl 3 optical path length 1 cm) |
0.00007% or less 220 nm (10 g / L NaI ASTM) 0.00007% or less 370 nm (50 g / L NaNO 2 ) 0.00005% or less 1420 nm (H 2 O pathlength 1 cm) |
| Detector |
Photomultiplier tube
|
Photomultiplier tube cooling type PbS photoconducting element |
Photomultiplier tube cooling type InGaAs photodiode |
|
Quantitative measurement
|
1,2,3 wavelength arithmetic calibration curve: linear, quadratic, cubic, proportional, polygonal line, logistic function, spline function |
||
| Spectral measurement |
Metering mode: Abs,% T,% R
|
||
| Time change measurement |
Metering mode: Abs,% T,% R
|
||
| Fixed wavelength measurement |
Up to 8 wavelengths can be measured at the same time
|
||
|
program
|
JASCO Spectrum Manager | ||
|
Dimensions / weight |
1020 (W) x 710 (D) x 380 (H) mm, 91 kg |
||
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