Material Analysis Applications

Technique	Title
UV-Vis	Absolute Reflectance Measurements of a Dichroic Mirror
UV-Vis	Amorphous Silicon Layer of a Solar Cell
FTIR	Analysis of Gases or Vapors with High Measurement Sensitivty
Raman	Carbon Nanotube Analysis by Raman Spectroscopy
Fluorescence	Chirality Analysis of Carbon Nanotubes
FTIR	Contaminant Analysis by Using IR Microscope
Raman	Contaminant in a Film
UV-Vis	Estimation of the Refractive Index of Monocrystalline Sapphire by Polarization Measurements using the MSV-5000 Series
FTIR	Evaluation of a Si Wafer Surface Using a 65-Degree Incident Angle ATR
Raman	Evaluation of Carrier Concentrations in GaN
UV-Vis	Evaluation of Filters and Mirrors
UV-Vis	Evaluation of ITO Films
Electric Field Modulation Spectrophotometer	Evaluation of Organic EL Materials
Raman	Evaluation of Polysilicon
FTIR	In-Situ Monitoring for Chemical Vapor Deposition (CVD)
FTIR	Infrared Microscopy Mapping measurement using the IQ Mapping function of IRT-5000 Microscope
Fluorescence	Luminescent Color Measurement
NFS	Measurement of the Transition Process of a Semiconductor
UV-Vis	Monitoring of Polysilicon Crystallization Using a Laser
NFS	Nanometer scale characterization of a GaAsP semiconductor
FTIR	Non-Contact, Non-Destructive Film Thickness Measurements in the IR or NIR Region
UV-Vis	On-Line Monitoring for Quality Control
UV-Vis	Phase Difference Measurements
Raman	Polymer State Analysis During an Injection Molding Process
FTIR	Qualitative Analysis of Semiconductor Contaminants
Raman	Single-Layer Carbon Nanotube
SFC	The Analysis of Polymer Additives using Supercritical Fluid Chromatography
Ellipsometry	Thickness Distribution of Thin Films
UV-Vis	Transmission Measurement of Volvox Algae Using the MSV-5000 Series
Circular Dichroism	Unfolding of Concanavalin A by the Trifluoroethanol
UV-Vis	Absolute Reflectance Measurements of SiO2
FTIR	Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer
Raman	Analysis of Impurities in Polumers Using a Non-Destructive Measurement Method
Raman	Carbon Nanotube Analysis by Raman Spectroscopy
UV-Vis	Color Analyses of Fluorescence Materials for FPD
NFS	Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer
Fluorescence	Development of New PDP Phosphors
NFS	Evaluation of a Luminescent Semiconductor on the Nanometer Scale
Raman	Evaluation of Carbon Materials
Raman	Evaluation of Diamond Like Carbon (DLC)
Fluorescence	Evaluation of Fluorescence Materials at a High Temperature
UV-Vis	Evaluation of Micro Optics
UV-Vis	Evaluation of Polarizers for FPDs
UV-Vis	Highly Accurate Measurements in the Vacuum UV Range
NFS	Infrared measurements with 1 µm spatial resolution
Fluorescence	Luminescence Efficiency Measurement
FTIR	Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory
FTIR	Model Analysis for FTIR Microscopy
Ellipsometry	Multi-Layer Film Analysis
NFS	Nanospectroscopy using a Near-Field Scanning Microspectrometer
FTIR	On-Line Monitoring by Using an Optical Fiber
NFS	Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement
Ellipsometry	Photoelastic Constant Measurements
FTIR	Portable Instrument System for Micro FT-IR On-Site Analysis
Raman	Semiconductor Stress Measurement
UV-Vis	SiO2 Layer Thickness Measurement
UV-Vis	Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern
Ellipsometry	Time-Resolved Measurements of Liquid Crystals
NFS	Transmittance Measurements in the UVVis/NIR Range at 100 nm to 1 µm Spatial Resolution

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Advanced Analytical Solutions For Your Science

Material Analysis Applications

Technique

Title

Advanced Analytical Solutions For Your Science